iSTART-TEK Obtained U.S. Patent, “Configurable Testing and Repair System for Non-Volatile Memory”

July 14, 2025 -- iSTART-TEK is proud to announce that we have been granted a U.S. invention patent for our “Configurable Testing and Repair System for Non-Volatile Memory”, reinforcing our leadership in advanced memory test and repair technologies.

This patented system enables a configurable flow that includes:

•  A memory testing device to determine whether a memory requires repair and to generate diagnostic defect data (fault address and fault value)
•  A memory repair device that executes repair based on diagnostic results
•  A control unit that orchestrates both testing and repair operations seamlessly

This innovation empowers iSTART-TEK to deliver more reliable, efficient, and flexible memory test solutions for our global partners.