iSTART-TEK Obtained U.S. Patent, “Configurable Testing and Repair System for Non-Volatile Memory”
July 14, 2025 -- iSTART-TEK is proud to announce that we have been granted a U.S. invention patent for our “Configurable Testing and Repair System for Non-Volatile Memory”, reinforcing our leadership in advanced memory test and repair technologies.
This patented system enables a configurable flow that includes:
- A memory testing device to determine whether a memory requires repair and to generate diagnostic defect data (fault address and fault value)
- A memory repair device that executes repair based on diagnostic results
- A control unit that orchestrates both testing and repair operations seamlessly
This innovation empowers iSTART-TEK to deliver more reliable, efficient, and flexible memory test solutions for our global partners.
Related Semiconductor IP
- MIL-STD-1553 Controller IP
- UFS 5.x Device IP
- UCIe 3.x Controller IP
- Ethernet 800G PCS IP
- CHI to UCIe Bridge IP
Related News
- CEA-Leti and Fraunhofer IPMS Validate Wafer Exchange for Ferroelectric Memory Materials Within the FAMES Pilot Line
- GSOC Solutions and Andes Technology Announce Strategic Partnership to Expand RISC-V CPU Options for Configurable SoC and Chiplet Platforms
- SK hynix and NVIDIA Announce Multi-year Technology Partnership to Advance Memory for AI Factories
- RAAAM Selects Avnet ASIC as its VCA Partner for TSMC’s 2nm GCRAM Development and Qualification
Latest News
- StarFive and LECARC Forge Partnership to Co-Develop RISC-V Server CPUs and Seize New Opportunities in the Agentic AI Era
- ASICLAND Selected as SK hynix’s Partner for Next-Gen eSSD Development, Establishing a ‘K-Semiconductor Win-Win’ Model
- onsemi to Acquire Synaptics to Enable the Next Generation of Intelligent Systems for Physical AI
- EdgeAI Licensed Andes Technology CPU IP to Power Next-Generation Edge AI Neuromorphic Solution
- Jim Keller: ‘AI Still Obeys the Old Laws of Compute’