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Single-event effects (SEEs) are of a growing concern in high-reliability system development, yet there is much disparity among users of application-specific integrated circuits (ASICs) and field-programmable gate arrays (FPGAs) with regard to understanding how susceptible their designs might be.
Design-level security features in 90nm non-volatile Spartan-3AN FPGAs from Xilinx address the issues of overbuilding, cloning, and reverse engineering.
The authors propose a monolithic-3D (M3D) 6T SRAM at the 2nm node, integrating BEOL IGO pass-gates (PGs) with an all-silicon nanosheet latch, buried power rails (BPRs), and Ru interconnects. TCAD calibrated to a state-of-the-art double-gate IGO transistor with a tri-layer HfO2/ZrO2/HfO2 (HZH) gate stack is combined with virtual fabrication and 3D parasitic extraction to realize the first process-aware layout of this topology.
This paper introduces a timing fragility aware selective hardening methodology for RISCV soft processors implemented on SRAM based FPGAs.
Vincent van der Leest, Synopsys