Vendor: Intellitech Corp. Category: Test / Debug

Scan Ring Linker enables multiple 1149.1 scan rings

Scan Ring Linker enables multiple 1149.1 scan rings

Key features

  • High-Speed 1149.1 routing
    • Better signal integrity for TCK/TMS signals
    • SRL provides superior distribution of TCK, TMS and TRST signals permitting high-speed test operation greater than 40Mbs/sec. PCB engineering is also reduced as SRL eliminates complex test signal routing.
  • Reduces part costs
    • SRL can be deployed as a single IC on a PCB to reduce the need for buffers and logic level translators. SRL permits devices in secondary scan chains to have their IO pins configured at different voltage levels. A single SRL device controls each scan chain regardless of their voltage.
  • Flexible implementation
    • SRL simplifies design with plug-and-play IP that is easily embedded into a CPLD, FPGA or ASIC.
  • High fault coverage on difficult to test signals
    • SRL enables high fault coverage with pin level diagnostics for 1149.1 test signals -- TCK, TMS, TDI, TDO. Each TCK, TMS, TDI and TDO pin has a boundary-scan cell that can be used to test for shorts and stuck-at faults.

Specifications

Identity

Part Number
SRL (TM)
Vendor
Intellitech Corp.
Type
Silicon IP

Files

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Provider

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Frequently asked questions about SerDes Test / Debug IP cores

What is Scan Ring Linker enables multiple 1149.1 scan rings?

Scan Ring Linker enables multiple 1149.1 scan rings is a Test / Debug IP core from Intellitech Corp. listed on Semi IP Hub.

How should engineers evaluate this Test / Debug?

Engineers should review the overview, key features, supported foundries and nodes, maturity, deliverables, and provider information before shortlisting this Test / Debug IP.

Can this semiconductor IP be compared with similar products?

Yes. Buyers can compare this product with similar semiconductor IP cores or IP families based on category, provider, process options, and structured technical specifications.

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