Overview
This 28nm GPIO is designed for high-speed (>150MHz output, >250MHz input) applications. The IO operates at either 1.8V or 3.3V and can dynamically switch between these voltages during operation. The cell is power sequence-independent and is fully self-protecting during the power ramp. A unique feature of the 28nm GPIO is its fail-safe capability. Though a full push-pull IO, the part can be powered down and leak low current from externally driven active signals, much like an open-drain IO.
Built into our IO libraries and also offered as a separate service is our strong ESD expertise. Certus was founded by ESD engineers, and our results speak for themselves. We consistently exceed 2KV HBM and 500V CDM ESD targets and provide on-chip solutions for standards such as IEC-61000-4-2, system-level ESD, and Cable Discharge Events (CDE).
Certus supports IO libraries across multiple TSMC nodes, including 180nm, 130nm, 40nm, 28nm, 22nm, and 16/12nm. Certus is particularly suited at providing custom variants in a cost-efficient framework. Please contact us for supplementary physical or electrical features that can suit your needs.
Learn more about Oscillator IP core
This blog will focus on what happens during the CDM pulse itself, and will show how the pulse properties change as a function of DUT to Field Plate capacitance.
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Integrated circuits are commonly tested for ESD robustness with 2 tests, Human Body Model (HBM) and Charged Device Model (CDM). Most engineers quickly grasp the procedure for HBM, but the CDM test is often poorly understood. This is unfortunate, because a large fraction of the ESD failures experienced in modern board assembly operations are CDM type failures. This article will describe the events which occur during a CDM test conducted using the widely accepted field induced CDM (FCDM) test.
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