21-input testmux, with LU protection at output
21-input testmux, has LU protection at output, can be used at chip I/O
- TSMC
- 180nm
- BCDG2
- Silicon Proven
21-input testmux, with LU protection at output
21-input testmux, has LU protection at output, can be used at chip I/O
Levelshifter low-to-high, used in HS driver
Levelshifter low-to-high, used in HS driver
Levelshifter high-to-low, used in HS driver
Levelshifter high-to-low, used in HS driver
4.25V...15V to 3.3V/120mA LDO
DCDC regu power stage, includes bootstrap regulator
DCDC regu power stage, includes bootstrap regulator
LS current replica block, 1:100'000
LS current replica block, 1:100'000, for LS switch current measurement
HS current replica block, 1:100'000
HS current replica block, 1:100'000, for HS switch current measurement
Ripple injector, feedback block for regulator output ripple measurement
LS power switch driver
HS power switch driver
HS bootstrap driver for HS NMOS gate voltage generation
HS bootstrap driver for HS NMOS gate voltage generation
20ns rising edge delay circuit, RC-based, trimmable
20ns rising edge delay circuit, RC-based, trimmable
150ns rising edge delay circuit, not trimmable
150ns rising edge delay circuit, bias current to C based, not trimmable
10ns rising edge delay circuit, RC-based, trimmable
10ns rising edge delay circuit, RC-based, trimmable
Adjustable delay block for dual-phase regulator operation
Adjustable delay block for dual-phase regulator operation
Inverter based delay chain, 5ns
Inverter based delay chain, 5ns
Inverter based delay chain, 10ns
Inverter based delay chain, 10ns
Zero-cross detector and valley OCP block, trimmable
Zero-cross detector and valley OCP block, trimmable
HS current protection circuit
Current monitor circuit, Vout=1.2V+0.06V*Iload
Current monitor circuit, Vout=1.2V+0.06V*Iload