Easy to change SRAM testing algorithms after CP phases EZ-TEC can coexist with the existing memory testing circuits of chip desig…
- Monitoring
Easy to change SRAM testing algorithms after CP phases EZ-TEC can coexist with the existing memory testing circuits of chip desig…
Easy to finish SRAM repair and data backup EZ-Safety is a dedicated IP designed for automotive electronic chips.
Easy to monitor lifecycle of SoC EZ-Monitor ensures the memory lifecycle within the chip, and effectively monitor the lifecycle o…
Implement all recommendation test items for hight test coverage The BIST can realize all eFlash testing items, covering UMC’s 40n…