Learn more about eFuse / OTP IP core
The hardware root of trust (HRoT) provides the trust base (root key), hardware identifier (UID), hardware unique key (HUK), and entropy required for the secure operation of the entire chip and therefore is often the focus of hacker attacks. If the design can’t effectively resist attacks, hackers can easily obtain the secrets of the entire chip. Attackers can use the secrets to crack identity authentication and data encryption and steal product design know-how, causing application security problems.
A sensor is a device that detects a change in a stimulus and converts it into an electronic signal that can be measured or recorded. The stimulus can be many things, including a physical property, environmental parameter, chemical composition or a location, to name just a few. All sensing elements have nonlinearities that include an intrinsic nonlinearity over sensing range along with offset and sensitivity nonlinearity variations over temperature.
With the invention of Physical Unclonable Functions (PUF), we can now create a unique, inborn, unclonable key at the hardware level. The natural follow-up question to this is, “but how do we protect this key?” It is like storing your key to secrets in a drawer, a surefire way to break the secure boundary and create vulnerabilities.
The market for piracy is huge and hackers have become increasingly sophisticated even when security is implemented in hardware. The race between the aggressors and protectors is a battle without end. Smart connected home devices are increasingly storing and processing very sensitive and private user data in addition to attempting to deliver copyright protected content from service providers. Protecting consumer data is vital.
While leading foundries keep pushing Moore’s law to the limit of physics, embedded non-volatile memory (eNVM) is becoming a game-changer in designing advanced integrated chips.
Patented by Attopsemi™, I-fuse™ is a revolutionary non-breaking fuse technology that can be reliably programmed by heat assisted electromigration below a break point. Any cell can be tested as programmable if the initial fuse resistance is low enough (e.g. <400 ohms) to generate enough heat for programming.
