Multi-Layer Deep Data Performance Monitoring and Optimization
By proteanTecs, Siemens Digital Industries Software
Combining functional and parametric monitoring of the real-world behavior of complex SoCs provides a powerful new approach that facilitates performance optimization during development and in the field, improves security and safety, and enables predictive maintenance to prevent field failures. proteanTecs’ Universal Chip Telemetry (UCT) and Siemens’ Tessent Embedded Analytics are complementary technologies that enable just such an approach, informed by Deep Data.
Examples based on ADAS and autonomous driving systems demonstrate how the two systems interact to shine a light on even the most complex problems in electronics design, production and deployment.
To read the full article, click here
Related Semiconductor IP
- Ultra Ethernet MAC & PCS 100G/200G/400G/800G
- Ethernet PCS 100G/200G/400G/800G/1.6T
- Ethernet MAC 100G/200G/400G/800G/1.6T
- Junction Over-Temperature Detector with Linear Centigrade-to-Voltage Output - X-FAB XT018
- Performance P570 Gen 3
Related Articles
- 片上网络(NoC)互连IP帮助系统级芯片实现功耗,性能和面积之间的有效优化
- 优化多核 SoC 设计中的通信和数据共享
- 芯动科技全系高端DDR IP解决方案行业领先,工艺全覆盖
- 通过集成自动化更好更快地创建 SoC 设计