Extreme Ultraviolet Lithography (EUV)
Extreme Ultraviolet Lithography (EUV) is an advanced semiconductor manufacturing technology used to print extremely small features onto silicon wafers during integrated circuit fabrication. EUV lithography uses light with a wavelength of approximately 13.5 nanometers, enabling the production of highly advanced semiconductor devices with very high transistor density.
EUV is considered one of the most important enabling technologies for modern semiconductor process nodes, including 7 nm, 5 nm, 3 nm, and future angstrom-class technologies.
The technology is primarily deployed in advanced fabrication facilities operated by companies such as TSMC, Samsung Electronics, and Intel using lithography systems supplied by ASML.
Background
Lithography is the process used in semiconductor manufacturing to transfer circuit patterns from a photomask onto a silicon wafer coated with photoresist material.
Historically, the semiconductor industry used progressively shorter wavelengths to increase transistor density:
| Technology | Wavelength |
|---|---|
| g-line | 436 nm |
| i-line | 365 nm |
| Deep Ultraviolet (DUV) | 248 nm / 193 nm |
| Extreme Ultraviolet (EUV) | 13.5 nm |
As transistor dimensions continued shrinking in accordance with Moore's Law, conventional DUV lithography increasingly required complex multiple-patterning techniques. EUV was developed to simplify patterning and improve scalability for advanced semiconductor nodes.
The Pulse
- Baya Systems选择AdoreSys为合作伙伴,拓展半导体IP在中国及亚太市场的覆盖
- Access Advance 启动 AV1/AV2 设备和软件专利池的探索阶段,邀请潜在许可方参与
- 新思科技与英特尔代工深化合作,赋能客户基于Intel 14A工艺节点实现从芯片到系统的开发就绪
- Perceptia 发布基于三星 14LPU 工艺平台的 pPLL03 设计套件
- 灿芯半导体发布28nm高性能SAR ADC IP,助力高速信号链应用升级
- 合见工软UCIe芯粒互联 IP助力东方算芯 3D 算力芯片开发面世,打通关键互联路径
- 赛昉科技推出服务器级RISC-V IP,加速智算中心算力生态战略布局
- 先进制程权利金年增近四倍 M31:布局逐步进入收成期
- SmartDV推出PCIe/CXL/UCIe协议转换与桥接IP,力助高性能芯片更加灵活地应对算力需求
- M31董事会通过私募现金增资案,引进策略投资人
- 新思科技携手 AMD 与微软,推进智能体 AI 芯片设计
- LTSCT 與晶心科技簽署策略性 IP 授權主合約:全面加速 RISC-V 先進半導體解決方案
- 新思科技发布基于英伟达技术打造的覆盖从芯片到系统完整自主化工程工作流
- 牛芯半导体与熙耀芯微签署战略合作备忘录
- M31 MIPI C/D-PHY在台积电 3 奈米的高速与长通道设计