Overview

Calibre xACT extraction

With its integrated fast 3D field solver and highly parallel architecture, the Calibre xACT parasitic extraction tool combines accuracy with the performance needed for multi-million instance designs.


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Technical paper

Parasitic extraction technologies for advanced node

The Calibre xACT solution offers parasitic extraction options for interconnect modeling that ensure accurate capture of parasitic and layout-dependent effects for non-planar devices in advanced node designs, simultaneous multi-corner extraction for efficient processing, and accurate identification of EM current density violations, as well as accurate extraction and modeling for 3D IC package designs.

Parasitic Extraction Technologies for Advanced Node and 3D-IC Design
Key Features

Performance and Accuracy for Leading-Edge Designs

Versatile parasitic extraction platform provides accurate, deterministic, repeatable results with 10x the performance of previous solutions to handle a wide range of designs and advanced processes

FAQ

Calibre xACT frequently asked questions

Calibre xACT featured resources

Explore our featured resources or visit the full Calibre xACT resource library to view on-demand webinars, white papers, and fact sheets.

Calibre xACT
Fact Sheet

Calibre xACT

The Calibre xACT platform quickly and accurately extracts parasitic capacitance, resistance and inductance for a variety of IC design styles, from digital to custom analog and RF.

Advancing the Art of Parasitic Extraction: The Calibre xACT Platform
Technical Paper

Advancing the Art of Parasitic Extraction: The Calibre xACT Platform

The Calibre xACT platform provides designers with a fast, highly accurate, and multi-purpose parasitic extraction tool that enables post-layout simulation across a wide range of designs and advanced process nodes.

Calibre xACT Parasitic Extraction Supports Signal Integrity at Advanced Nodes
Technical Paper

Calibre xACT Parasitic Extraction Supports Signal Integrity at Advanced Nodes

At advanced nodes, signal integrity analysis requires precise characterization, which in turn requires an accurate extracted netlist.

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